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X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière
| X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière |
| Autore | Guinebretiere René |
| Pubbl/distr/stampa | London ; ; Newport Beach, CA, : ISTE, 2007 |
| Descrizione fisica | 1 online resource (385 p.) |
| Disciplina |
548.83
548/.83 |
| Collana | ISTE |
| Soggetto topico |
X-rays - Diffraction
Crystallography |
| ISBN |
1-280-84764-6
9786610847648 0-470-61240-1 0-470-39453-6 1-84704-571-5 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
X-ray Diffraction by Polycrystalline Materials; Table of Contents; Preface; Acknowledgements; An Historical Introduction: The Discovery of X-rays and the First Studies in X-ray Diffraction; Part 1. Basic Theoretical Elements, Instrumentation and Classical Interpretations of the Results; Chapter 1. Kinematic and Geometric Theories of X-ray Diffraction; 1.1. Scattering by an atom; 1.1.1. Scattering by a free electron; 1.1.1.1. Coherent scattering: the Thomson formula; 1.1.1.2. Incoherent scattering: Compton scattering [COM 23]; 1.1.2. Scattering by a bound electron
1.1.3. Scattering by a multi-electron atom1.2. Diffraction by an ideal crystal; 1.2.1. A few elements of crystallography; 1.2.1.1. Direct lattice; 1.2.1.2. Reciprocal lattice; 1.2.2. Kinematic theory of diffraction; 1.2.2.1. Diffracted amplitude: structure factor and form factor; 1.2.2.2. Diffracted intensity; 1.2.2.3. Laue conditions [FRI 12]; 1.2.3. Geometric theory of diffraction; 1.2.3.1. Laue conditions; 1.2.3.2. Bragg's law [BRA 13b, BRA 15]; 1.2.3.3. The Ewald sphere; 1.3. Diffraction by an ideally imperfect crystal; 1.4. Diffraction by a polycrystalline sample Chapter 2. Instrumentation used for X-ray Diffraction2.1. The different elements of a diffractometer; 2.1.1. X-ray sources; 2.1.1.1. Crookes tubes; 2.1.1.2. Coolidge tubes; 2.1.1.3. High intensity tubes; 2.1.1.4. Synchrotron radiation; 2.1.2. Filters and monochromator crystals; 2.1.2.1. Filters; 2.1.2.2. Monochromator crystals; 2.1.2.3. Multi-layered monochromators or mirrors; 2.1.3. Detectors; 2.1.3.1. Photographic film; 2.1.3.2. Gas detectors; 2.1.3.3. Solid detectors; 2.2. Diffractometers designed for the study of powdered or bulk polycrystalline samples 2.2.1. The Debye-Scherrer and Hull diffractometer2.2.1.1. The traditional Debye-Scherrer and Hull diffractometer; 2.2.1.2. The modern Debye-Scherrer and Hill diffractometer: use of position sensitive detectors; 2.2.2. Focusing diffractometers: Seeman and Bohlin diffractometers; 2.2.2.1. Principle; 2.2.2.2. The different configurations; 2.2.3. Bragg-Brentano diffractometers; 2.2.3.1. Principle; 2.2.3.2. Description of the diffractometer; path of the X-ray beams; 2.2.3.3. Depth and irradiated volume; 2.2.4. Parallel geometry diffractometers; 2.2.5. Diffractometers equipped with plane detectors 2.3. Diffractometers designed for the study of thin films2.3.1. Fundamental problem; 2.3.1.1. Introduction; 2.3.1.2. Penetration depth and diffracted intensity; 2.3.2. Conventional diffractometers designed for the study of polycrystalline films; 2.3.3. Systems designed for the study of textured layers; 2.3.4. High resolution diffractometers designed for the study of epitaxial films; 2.3.5. Sample holder; 2.4. An introduction to surface diffractometry; Chapter 3. Data Processing, Extracting Information; 3.1. Peak profile: instrumental aberrations; 3.1.1. X-ray source: g1(ε); 3.1.2. Slit: g2(ε) 3.1.3. Spectral width: g3(ε) |
| Record Nr. | UNINA-9910143313003321 |
Guinebretiere René
|
||
| London ; ; Newport Beach, CA, : ISTE, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière
| X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière |
| Autore | Guinebretiere René |
| Pubbl/distr/stampa | London ; ; Newport Beach, CA, : ISTE, 2007 |
| Descrizione fisica | 1 online resource (385 p.) |
| Disciplina |
548.83
548/.83 |
| Collana | ISTE |
| Soggetto topico |
X-rays - Diffraction
Crystallography |
| ISBN |
1-280-84764-6
9786610847648 0-470-61240-1 0-470-39453-6 1-84704-571-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
X-ray Diffraction by Polycrystalline Materials; Table of Contents; Preface; Acknowledgements; An Historical Introduction: The Discovery of X-rays and the First Studies in X-ray Diffraction; Part 1. Basic Theoretical Elements, Instrumentation and Classical Interpretations of the Results; Chapter 1. Kinematic and Geometric Theories of X-ray Diffraction; 1.1. Scattering by an atom; 1.1.1. Scattering by a free electron; 1.1.1.1. Coherent scattering: the Thomson formula; 1.1.1.2. Incoherent scattering: Compton scattering [COM 23]; 1.1.2. Scattering by a bound electron
1.1.3. Scattering by a multi-electron atom1.2. Diffraction by an ideal crystal; 1.2.1. A few elements of crystallography; 1.2.1.1. Direct lattice; 1.2.1.2. Reciprocal lattice; 1.2.2. Kinematic theory of diffraction; 1.2.2.1. Diffracted amplitude: structure factor and form factor; 1.2.2.2. Diffracted intensity; 1.2.2.3. Laue conditions [FRI 12]; 1.2.3. Geometric theory of diffraction; 1.2.3.1. Laue conditions; 1.2.3.2. Bragg's law [BRA 13b, BRA 15]; 1.2.3.3. The Ewald sphere; 1.3. Diffraction by an ideally imperfect crystal; 1.4. Diffraction by a polycrystalline sample Chapter 2. Instrumentation used for X-ray Diffraction2.1. The different elements of a diffractometer; 2.1.1. X-ray sources; 2.1.1.1. Crookes tubes; 2.1.1.2. Coolidge tubes; 2.1.1.3. High intensity tubes; 2.1.1.4. Synchrotron radiation; 2.1.2. Filters and monochromator crystals; 2.1.2.1. Filters; 2.1.2.2. Monochromator crystals; 2.1.2.3. Multi-layered monochromators or mirrors; 2.1.3. Detectors; 2.1.3.1. Photographic film; 2.1.3.2. Gas detectors; 2.1.3.3. Solid detectors; 2.2. Diffractometers designed for the study of powdered or bulk polycrystalline samples 2.2.1. The Debye-Scherrer and Hull diffractometer2.2.1.1. The traditional Debye-Scherrer and Hull diffractometer; 2.2.1.2. The modern Debye-Scherrer and Hill diffractometer: use of position sensitive detectors; 2.2.2. Focusing diffractometers: Seeman and Bohlin diffractometers; 2.2.2.1. Principle; 2.2.2.2. The different configurations; 2.2.3. Bragg-Brentano diffractometers; 2.2.3.1. Principle; 2.2.3.2. Description of the diffractometer; path of the X-ray beams; 2.2.3.3. Depth and irradiated volume; 2.2.4. Parallel geometry diffractometers; 2.2.5. Diffractometers equipped with plane detectors 2.3. Diffractometers designed for the study of thin films2.3.1. Fundamental problem; 2.3.1.1. Introduction; 2.3.1.2. Penetration depth and diffracted intensity; 2.3.2. Conventional diffractometers designed for the study of polycrystalline films; 2.3.3. Systems designed for the study of textured layers; 2.3.4. High resolution diffractometers designed for the study of epitaxial films; 2.3.5. Sample holder; 2.4. An introduction to surface diffractometry; Chapter 3. Data Processing, Extracting Information; 3.1. Peak profile: instrumental aberrations; 3.1.1. X-ray source: g1(ε); 3.1.2. Slit: g2(ε) 3.1.3. Spectral width: g3(ε) |
| Record Nr. | UNISA-996217139303316 |
|
Guinebretiere René
|
||
| London ; ; Newport Beach, CA, : ISTE, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière
| X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière |
| Autore | Guinebretiere René |
| Pubbl/distr/stampa | London ; ; Newport Beach, CA, : ISTE, 2007 |
| Descrizione fisica | 1 online resource (385 p.) |
| Disciplina |
548.83
548/.83 |
| Collana | ISTE |
| Soggetto topico |
X-rays - Diffraction
Crystallography |
| ISBN |
1-280-84764-6
9786610847648 0-470-61240-1 0-470-39453-6 1-84704-571-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
X-ray Diffraction by Polycrystalline Materials; Table of Contents; Preface; Acknowledgements; An Historical Introduction: The Discovery of X-rays and the First Studies in X-ray Diffraction; Part 1. Basic Theoretical Elements, Instrumentation and Classical Interpretations of the Results; Chapter 1. Kinematic and Geometric Theories of X-ray Diffraction; 1.1. Scattering by an atom; 1.1.1. Scattering by a free electron; 1.1.1.1. Coherent scattering: the Thomson formula; 1.1.1.2. Incoherent scattering: Compton scattering [COM 23]; 1.1.2. Scattering by a bound electron
1.1.3. Scattering by a multi-electron atom1.2. Diffraction by an ideal crystal; 1.2.1. A few elements of crystallography; 1.2.1.1. Direct lattice; 1.2.1.2. Reciprocal lattice; 1.2.2. Kinematic theory of diffraction; 1.2.2.1. Diffracted amplitude: structure factor and form factor; 1.2.2.2. Diffracted intensity; 1.2.2.3. Laue conditions [FRI 12]; 1.2.3. Geometric theory of diffraction; 1.2.3.1. Laue conditions; 1.2.3.2. Bragg's law [BRA 13b, BRA 15]; 1.2.3.3. The Ewald sphere; 1.3. Diffraction by an ideally imperfect crystal; 1.4. Diffraction by a polycrystalline sample Chapter 2. Instrumentation used for X-ray Diffraction2.1. The different elements of a diffractometer; 2.1.1. X-ray sources; 2.1.1.1. Crookes tubes; 2.1.1.2. Coolidge tubes; 2.1.1.3. High intensity tubes; 2.1.1.4. Synchrotron radiation; 2.1.2. Filters and monochromator crystals; 2.1.2.1. Filters; 2.1.2.2. Monochromator crystals; 2.1.2.3. Multi-layered monochromators or mirrors; 2.1.3. Detectors; 2.1.3.1. Photographic film; 2.1.3.2. Gas detectors; 2.1.3.3. Solid detectors; 2.2. Diffractometers designed for the study of powdered or bulk polycrystalline samples 2.2.1. The Debye-Scherrer and Hull diffractometer2.2.1.1. The traditional Debye-Scherrer and Hull diffractometer; 2.2.1.2. The modern Debye-Scherrer and Hill diffractometer: use of position sensitive detectors; 2.2.2. Focusing diffractometers: Seeman and Bohlin diffractometers; 2.2.2.1. Principle; 2.2.2.2. The different configurations; 2.2.3. Bragg-Brentano diffractometers; 2.2.3.1. Principle; 2.2.3.2. Description of the diffractometer; path of the X-ray beams; 2.2.3.3. Depth and irradiated volume; 2.2.4. Parallel geometry diffractometers; 2.2.5. Diffractometers equipped with plane detectors 2.3. Diffractometers designed for the study of thin films2.3.1. Fundamental problem; 2.3.1.1. Introduction; 2.3.1.2. Penetration depth and diffracted intensity; 2.3.2. Conventional diffractometers designed for the study of polycrystalline films; 2.3.3. Systems designed for the study of textured layers; 2.3.4. High resolution diffractometers designed for the study of epitaxial films; 2.3.5. Sample holder; 2.4. An introduction to surface diffractometry; Chapter 3. Data Processing, Extracting Information; 3.1. Peak profile: instrumental aberrations; 3.1.1. X-ray source: g1(ε); 3.1.2. Slit: g2(ε) 3.1.3. Spectral width: g3(ε) |
| Record Nr. | UNINA-9910830661603321 |
|
Guinebretiere René
|
||
| London ; ; Newport Beach, CA, : ISTE, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière
| X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière |
| Autore | Guinebretiere René |
| Pubbl/distr/stampa | London ; ; Newport Beach, CA, : ISTE, 2007 |
| Descrizione fisica | 1 online resource (385 p.) |
| Disciplina |
548.83
548/.83 |
| Collana | ISTE |
| Soggetto topico |
X-rays - Diffraction
Crystallography |
| ISBN |
1-280-84764-6
9786610847648 0-470-61240-1 0-470-39453-6 1-84704-571-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
X-ray Diffraction by Polycrystalline Materials; Table of Contents; Preface; Acknowledgements; An Historical Introduction: The Discovery of X-rays and the First Studies in X-ray Diffraction; Part 1. Basic Theoretical Elements, Instrumentation and Classical Interpretations of the Results; Chapter 1. Kinematic and Geometric Theories of X-ray Diffraction; 1.1. Scattering by an atom; 1.1.1. Scattering by a free electron; 1.1.1.1. Coherent scattering: the Thomson formula; 1.1.1.2. Incoherent scattering: Compton scattering [COM 23]; 1.1.2. Scattering by a bound electron
1.1.3. Scattering by a multi-electron atom1.2. Diffraction by an ideal crystal; 1.2.1. A few elements of crystallography; 1.2.1.1. Direct lattice; 1.2.1.2. Reciprocal lattice; 1.2.2. Kinematic theory of diffraction; 1.2.2.1. Diffracted amplitude: structure factor and form factor; 1.2.2.2. Diffracted intensity; 1.2.2.3. Laue conditions [FRI 12]; 1.2.3. Geometric theory of diffraction; 1.2.3.1. Laue conditions; 1.2.3.2. Bragg's law [BRA 13b, BRA 15]; 1.2.3.3. The Ewald sphere; 1.3. Diffraction by an ideally imperfect crystal; 1.4. Diffraction by a polycrystalline sample Chapter 2. Instrumentation used for X-ray Diffraction2.1. The different elements of a diffractometer; 2.1.1. X-ray sources; 2.1.1.1. Crookes tubes; 2.1.1.2. Coolidge tubes; 2.1.1.3. High intensity tubes; 2.1.1.4. Synchrotron radiation; 2.1.2. Filters and monochromator crystals; 2.1.2.1. Filters; 2.1.2.2. Monochromator crystals; 2.1.2.3. Multi-layered monochromators or mirrors; 2.1.3. Detectors; 2.1.3.1. Photographic film; 2.1.3.2. Gas detectors; 2.1.3.3. Solid detectors; 2.2. Diffractometers designed for the study of powdered or bulk polycrystalline samples 2.2.1. The Debye-Scherrer and Hull diffractometer2.2.1.1. The traditional Debye-Scherrer and Hull diffractometer; 2.2.1.2. The modern Debye-Scherrer and Hill diffractometer: use of position sensitive detectors; 2.2.2. Focusing diffractometers: Seeman and Bohlin diffractometers; 2.2.2.1. Principle; 2.2.2.2. The different configurations; 2.2.3. Bragg-Brentano diffractometers; 2.2.3.1. Principle; 2.2.3.2. Description of the diffractometer; path of the X-ray beams; 2.2.3.3. Depth and irradiated volume; 2.2.4. Parallel geometry diffractometers; 2.2.5. Diffractometers equipped with plane detectors 2.3. Diffractometers designed for the study of thin films2.3.1. Fundamental problem; 2.3.1.1. Introduction; 2.3.1.2. Penetration depth and diffracted intensity; 2.3.2. Conventional diffractometers designed for the study of polycrystalline films; 2.3.3. Systems designed for the study of textured layers; 2.3.4. High resolution diffractometers designed for the study of epitaxial films; 2.3.5. Sample holder; 2.4. An introduction to surface diffractometry; Chapter 3. Data Processing, Extracting Information; 3.1. Peak profile: instrumental aberrations; 3.1.1. X-ray source: g1(ε); 3.1.2. Slit: g2(ε) 3.1.3. Spectral width: g3(ε) |
| Record Nr. | UNINA-9910841037403321 |
|
Guinebretiere René
|
||
| London ; ; Newport Beach, CA, : ISTE, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||